Statistics for Bias-Stress Stability and Charge-Carrier Trapping in High Performance Organic Thin-Film Transistors

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Bias-Stress Stability and Charge-Carrier Trapping in High Performance Organic Thin-Film Transistors 5

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June 2024 2
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01_title.pdf 3
03_table of contents.pdf 2
04_abstract.pdf 1
02_prelim pages.pdf 1